Nikon Spinning Disk Microscope

Nikon Spinning Disk/ high content screening system enables capturing of high-quality confocal images at high-speed. The system includes the Yokogawa W1 Spinning Disk with wide field of view. Two discs are integrated with 25µm and 50µm pinholes, for optimal imaging with different objectives. A new pinhole design significantly reduces pinhole crosstalk, which is particularly important with thicker specimens. The system is mounted on the new Nikon motorized fluorescent microscope Ti2E. A Nikon Perfect Focus System (PFS) is included that continuously determines the distance to the sample. Life cell imaging is possible because the system is equipped with an on-stage incubation chamber controlling temperature, CO2-concentration and humidity. The system is equipped with 405/488/561/638 nm lasers. Nikon Spinning Disk is equipped with 2 SCMOS ZYLA cameras for applications requiring simultaneous two channels emission. The system has Piezo Z stage for fast and accurate Z stack imaging. The system includes the NIS Elements software package for multi-dimensional experiments, with JOBS for high content acquisition and analysis, deconvolution, tracking, 3D automatic measurements.

 

Nikon Spinning Disk/ high content screening system Specifications:

  Lasers

 405 nm, 488 nm, 561nm, 638nm. 

 Cameras

 2 SCMOS ZYLA cameras.

 Spinning Disk

 Yokogawa W1 Spinning Disk.

 Pinhole

 25µm and 50µm pinholes.

 Microscope Body

 Motorized fluorescent microscope Ti2E with Z drive and motorized XY stage.

 Z step

 Motorized Piezo Z stage

 Objectives

 

Magnification

N.A.

Immersion

Type

10X

0.45

dry

Plan-Apochromat Lambda

20X

0.75

dry

CFI PLAN APO VC

40X

0.95

dry

CFI  Plan-Apochromat

60X

0.95

dry

CFI  Plan-Apochromat  Lambda

100X

1.4

oil

Plan-Apochromat

 

 Incubation chamber

 Incubation chamber Okolab that controls temperature,   CO2 and humidity.

 Software

 NIS Elements software package for multi-dimensional   experiments, with JOBS for high content acquisition and   analysis, deconvolution, tracking, 3D automatic   measurements.

 

 

 

   
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